The series “Journey into the depth of things” is developed from Pham Minh Hieu’s graduation thesis at Stanford University. Using a scanning electron microscope (SEM) and a focused ion beam (FIB) machine, the artist constructs images—worlds—where entanglement occurs between the observer, the observing device, and the observed object. The artwork won the prestigious John Shively Fowler Prize in Photography from Stanford University, given to students who have successfully completed their thesis with a unique perspective on photography.

The body of work was expressed through multiple mediums and iterations, and continues to be an ongoing project.